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Samsung M393B4G70BM0-YH909 32GB DDR3-1333MHz RDIMM 4Rx4 CL9 Memory
- Memory Size: 32 GB
- Memory Type: DDR3 RDIMM
- Speed: 1333 MHz (PC3-10600)
- Form Factor: DIMM
- Pin Configuration: 240-pin
- ECC: Registered ECC
- Rank: 4Rx4 (Quad Rank x4)
- CAS Latency: CL9
- Voltage: 1.5V
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Product Overview
The Samsung M393B4G70BM0-YH909 is a 32GB DDR3-1333MHz RDIMM memory module. It is designed for servers and workstations requiring high capacity and reliability.
Technical Information
| Memory Size | 32 GB |
| Memory Type | DDR3 RDIMM |
| Speed | 1333 MHz (PC3-10600) |
| Form Factor | DIMM |
| Pin Configuration | 240-pin |
Additional Specifications
| ECC | Registered ECC |
| Rank | 4Rx4 |
| CAS Latency | CL9 |
| Voltage | 1.5V |
Product Description
This Samsung memory module, SKU M393B4G70BM0-YH909, is a high-capacity 32 Gigabyte (GB) Registered Dual In-line Memory Module (RDIMM) for DDR3 systems. It operates at a speed of 1333 MHz, corresponding to the PC3-10600 standard, and features a CAS Latency (CL) of 9. The 240-pin DIMM form factor is standard for DDR3 memory modules used in servers and high-end workstations. The module is a Quad Rank (4Rx4) configuration, meaning it has four banks of memory chips, each with four data lines. This design allows for higher memory density and can improve performance in systems that can effectively utilize multiple ranks. As an RDIMM, it includes onboard registers that buffer memory addresses and commands, reducing the electrical load on the memory controller and enabling higher memory capacities and improved system stability, which is critical in server environments. Furthermore, this module supports Error-Correcting Code (ECC) functionality, essential for maintaining data integrity in mission-critical applications. ECC memory can detect and correct single-bit errors, preventing data corruption and system crashes. With a standard operating voltage of 1.5V, this 32GB DDR3 RDIMM is designed for enterprise-grade servers and workstations that demand high performance, large memory capacity, and robust reliability.



