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Micron MTA18ASF2G72XF1Z-2G9WP1AB 16GB DDR4-2933MHz NVDIMM 1Rx4 Memory
- Capacity: 16GB
- Type: DDR4 NVDIMM
- Speed: 2933MHz
- Configuration: 1Rx4 (Single Rank x4)
- Voltage: 1.2V
- Features non-volatile data storage
- Ideal for mission-critical applications requiring data persistence
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For government, enterprise, data center, and small business customers.
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Product Overview
This Micron 16GB DDR4 NVDIMM module offers high-speed, non-volatile memory for critical applications. It provides data persistence during power loss, ensuring data integrity and faster recovery times.
Technical Information
| Memory Type | DDR4 NVDIMM |
| Capacity | 16GB |
| Speed | 2933MHz |
Additional Specifications
| Rank | 1Rx4 |
| Voltage | 1.2V |
Product Description
The Micron MTA18ASF2G72XF1Z-2G9WP1AB is a 16GB DDR4 Non-Volatile Dual In-line Memory Module (NVDIMM) designed for enterprise-level applications where data persistence is paramount. This module combines the high performance of DRAM with the non-volatility of NAND flash, ensuring that data is retained even in the event of a power failure. This feature is crucial for applications such as databases, transaction processing, and caching, where data loss can have severe consequences. Operating at a speed of 2933MHz, this NVDIMM offers rapid data access and transfer rates, significantly boosting application performance. The 1Rx4 organization indicates a single rank with four data bits per chip, optimizing signal integrity and performance in compatible server and workstation environments. The module operates at a standard voltage of 1.2V, ensuring compatibility with a wide range of DDR4-supporting systems. This memory solution is particularly beneficial for high-availability systems that require rapid recovery from unexpected shutdowns. By preserving critical data in volatile memory, it eliminates the need for lengthy data reloads and minimizes downtime. The MTA18ASF2G72XF1Z-2G9WP1AB is engineered for reliability and performance, making it a valuable component for demanding computing tasks.


