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Micron MTA18ASF1G72PDZ-2G3B 8GB DDR4-2400MHz RDIMM 2Rx8 CL17 Memory
- Capacity: 8GB
- Type: DDR4 SDRAM
- Form Factor: RDIMM (Registered DIMM)
- Speed: 2400MHz (PC4-19200)
- Latency: CL17
- Rank: 2Rx8 (Dual Rank x8)
- Voltage: 1.2V
- ECC: Yes (Error-Correcting Code)
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Product Overview
This Micron 8GB DDR4 RDIMM is designed for servers and high-performance workstations. It operates at a speed of 2400MHz with a CL17 latency, offering reliable and efficient memory performance for demanding applications.
Technical Information
| Memory Type | DDR4 SDRAM |
| Capacity | 8GB |
| Speed | 2400MHz |
| Form Factor | RDIMM |
Additional Specifications
| CAS Latency | CL17 |
| Rank | 2Rx8 |
| Voltage | 1.2V |
| ECC | Registered |
Product Description
The Micron MTA18ASF1G72PDZ-2G3B is a high-density, high-performance 8GB DDR4 Registered DIMM (RDIMM) module. Engineered for server and workstation environments, it leverages the latest DDR4 technology to deliver enhanced bandwidth and reduced power consumption compared to previous generations. Its 2400MHz clock speed and CL17 latency ensure rapid data access, making it suitable for memory-intensive tasks such as virtualization, large database operations, and complex simulations. This module features a 2Rx8 configuration, indicating it is dual-rank with eight internal memory chips per rank. This design can improve performance by allowing the memory controller to access different ranks independently, thereby increasing efficiency. The RDIMM form factor includes an onboard register that buffers command and address signals, reducing electrical load on the memory controller and enabling higher memory capacities and densities. With Error-Correcting Code (ECC) capabilities, the MTA18ASF1G72PDZ-2G3B can detect and correct single-bit errors in real-time, significantly improving system stability and data integrity. This is crucial for mission-critical applications where data accuracy and uptime are paramount. The module operates at a standard 1.2V, contributing to overall system power efficiency.
